DI/VEECO Offers Advanced Training in AFM of Polymers
April 11, 2001
Digital Instruments, Veeco Metrology (DI/VEECO) is offering a new course for Advanced Training on Atomic Force Microscopy (AFM) of Polymers for NanoScope(R) users, to be held June 20-22 in Santa Barbara, Calif. The course is designed to help users improve their knowledge of AFM techniques as well as to acquaint them with new approaches to polymer imaging.
To register or for additional information, call (800) 873-9750, ext. 2304, or visit http://www.di.com.