NSL Analytical Services recently announced that it has acquired an ATOMCOMP 2000, a DC arc spectrograph with a charge injection detector (CID). This instrument enhances NSL's materials testing capabilities by enabling lower detection limits on many elements and faster turnaround times of solid samples. It also gives NSL the capability to run more complex matrices while retaining all of the analytical techniques particular to the old technology of the photographic emission spectrometer.
Our annual R&D Lab Equipment and Instrumentation Directory helps you locate the best suppliers for your needs. This issue also includes articles focused on deformation and tension, materials characterization trends, non-destructive imaging, and more. Check it out!