JEOL: New Scanning Probe Microscope
January 13, 2003
A new multi-function scanning probe microscope (SPM) from JEOL gives researchers the ability to observe the physical properties of specimens in their native environments. Using the JEOL JSPM-5200, scientists have greater control over the SPM imaging environment, allowing them to examine cooled or heated samples in fluid, controlled or ambient air, or vacuum. The JSPM-5200 combines high-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) in one versatile instrument that reveals images never before achievable with conventional scanning probe microscopes.
For additional information, call (978) 535-5900 or visit http://www.jeol.com .