X-Tek: Series of Software Upgrades
February 19, 2003
X-Tek has recently announced the launch of a range of software upgrades available across its line of real-time microfocus X-ray inspection systems. A total of five new features are on release and available free of charge to any customers who have purchased X-Tek systems within the last two years. They include a 3-D waterfall display that can be generated from a 2-D image, an auto-focusing feature for all applications and improved support for the use of the latest flat panel sensors. Two upgrades specifically designed for the electronics inspection market are a drill offset measurement tool for PCB inspection and a Microsoft Excel output facility designed for BGA results analysis.
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