JEOL USA recently introduced a new Micro-Raman spectrometer that extends the analytical capabilities of scanning electron microscopy. The Renishaw SEM-Raman, when installed in the JEOL SEM, pinpoints the exact chemical identities of molecular compositions, making it a powerful materials characterization tool. "The SEM-Raman will extend the SEM's range of sample analysis, enabling it to determine chemical, electronic and atomic structure," said Charlie Nielsen, vice president of JEOL. "It can accurately identify polymer materials, which gives the microscopist a whole new level of detail."
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