Philips Analytical: X-Ray Diffractometer
April 23, 2002
Philips Analytical recently announced the availability of two new high-speed X-ray diffractometers that are optimized for industrial applications. The CubiX PRO and CubiX FAST satisfy stringent quality control requirements in high-throughput production environments by delivering fast, reliable and reproducible results from XRD analysis of key compounds. The CubiX FAST is capable of bringing total analysis time down from hours to just minutes, thanks to its Philips X'Celerator, an X-ray detector based on real time multiple strip (RTMS) technology. It is up to 100 times faster than conventional detection technology for a complete diffraction pattern without compromising on resolution, data quality or ease of use.
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