Metrology Resource: White Light Interferometer
November 10, 2004
Metrology Resource Co. recently introduced a new optical measurement system based on white light interferometry, a non-contact process that allows users to measure surface topography without target damage. Ideal for small area measurement applications in various industries, the high-speed, highly accurate white light interferometer (WLI) doesn't damage or destroy targets and requires less calibration than traditional tactile measuring equipment. The WLI measures surface profile, roughness, step height, microstructure and other surface parameters. A reference point mirror or object driven by a motorized or piezo drive allows measurement within extremely tight tolerances, such as grooves for optimum quality control and precision.