W. M. Hague Co. will exhibit new technologies and systems for testing ceramic based circuitry, laser trimming, solderability test and SIR test at the IMAPS 2005 show in Philadelphia, Pa., September 25-29. Technologies on display will include the new PHE Non-Contact C4 Semiconductor Package Tester. The PHE features a galvo-operated laser for die side open tests, coupled with conventional spring probe fixturing that accesses the BGA side for shorts tests. The company will also offer its R-580 electrical tester for semiconductor packages, flex and HDI PCBs. The R-580 system, when combined with a low-cost hand press fixture, provides a very low-cost solution to challenging test situations.
For more information, call (978) 433-3777, fax (978) 433-3690, e-mail email@example.com or visit http://www.wmhague.com.