RIT Selects Matec Micro Electronics' Mi-Scan For Sam Inspection
February 16, 2004
Matec Micro Electronics (MME) recently announced that the Center for Electronics Manufacturing and Assembly (CEMA) at the Rochester Institute of Technology (RIT) has selected MME's MI-SCAN system for ultrasonic scanning acoustic microscopy (SAM) inspection within the Surface Mount Technology Laboratory. CEMA provides facilities, equipment, capabilities and technical expertise to help manufacturers improve process yields and productivity while lowering costs. RIT and MME have formed a partnership to work together and share expertise. MME will provide training and support to CEMA in exchange for applied R&D activities to develop partner solutions, and access to the lab for demonstrations.