Micromeritics will present a series of workshops discussing the
details of the new ANSI/ISO Standard for Laser Particle Size Analysis. The recently released ANSI/ISO Standard 13320-1:1999, "Particle size analysis - Laser diffraction methods," responds to the need to provide a method for adequate quality control
in particle size analysis by laser diffraction methods. A copy of the document will be distributed to all workshop attendees. The standard
discusses all aspects of static light scattering particle size analysis in general terms. Topics include repeatability, accuracy
(including validation and sources of error), resolution, analysis
precautions, and theoretical background of laser scattering. The
basic principles of particle sizing by static light scattering, instrument design, and data reduction methods will be discussed, and there will be practical demonstrations of some of the topics discussed.
The fall workshops will be conducted in the following locations:
Atlanta, Ga., September 28; Research Triangle, N.C., October 3; Ann
Arbor, Mich., October 5; Princeton, N.J., October 10; Pittsburgh,
Pa., October 12; Chicago, Ill., October 17; Houston, Texas, November
8; New Orleans, La., November 11; Boston, Mass., November 14; San
Francisco, Calif., November 28; and Los Angeles, Calif., November 30.
For more information, call (770) 662-3600, fax (770) 662-3696 or