Digital Instruments, Veeco Metrology Group recently announced the release of a new data sheet, "NanoScope IV SPM Controller: Gateway to the Future of SPM." This data sheet reviews faster scanning for increased productivity, OneScanTM
technology, AFM Prob Q-Control, phase detection magnetic force microscopy (MFM), and flexibility and expandability of the NanoScope IV controller. The NanoScope IV improves conventional scanning probe microscopy (SPM) and atomic force microscopy (AFM) systems. Benefits include up to 10 times faster scanning, up to 100 times higher lateral data resolution on large scans, up to 10 times higher sensitivity, improved accuracy of positioning, and expanded customizable measurement and analysis capabilities.
To access the data sheet online, visit http://www.di.com
Additional information can also be found at http://www.veeco.com.