Matec Micro Electronics (MME) introduced its new MI-SCAN scanning acoustic microscope (SAM) last year and since then has built a library of analysis software. Features of the software include an auto dynamic contrast control button; signal peak detection selection, including peak-to-peak, absolute peak, + peak, - peak, and + or - edge; graphic interpolation modes for the C-scan images; instant conversion of C-scan images and A-scan displays to ASCII file format; and instant display of the scan and index location, percent FSH, and microsecond readout of TOF as users point the mouse cursor over the image. These features expand the operator's capability to better analyze scanned parts.

For more information, call (215) 369-8077 or e-mail jstradling@matec.com .