Following highly successful atomic force microscopy (AFM) technical
sessions in '98, '99, and '00, a fourth symposium will be held at
PittCon 2001 in New Orleans on March 5. The PittCon 2001 symposium,
chaired by Monte Heaton of AFM leader Digital Instruments/Veeco
Metrology (Santa Barbara, Calif.), will focus on a variety of
applications of AFM, including biology, materials science and
polymers. A special talk will be given explaining the advantages and
complementary capabilities of AFM relative to other microscopies
(SEM, TEM) and analytical techniques.
For those who cannot attend the Symposium, portions will be
webcast on www.Yahoo.com. Please access http://www.di.com for webcast
registration information.
