Atomic Force Microscopy Session To Be Held At PITTCON 2001
January 3, 2001
Following highly successful atomic force microscopy (AFM) technical sessions in '98, '99, and '00, a fourth symposium will be held at PittCon 2001 in New Orleans on March 5. The PittCon 2001 symposium, chaired by Monte Heaton of AFM leader Digital Instruments/Veeco Metrology (Santa Barbara, Calif.), will focus on a variety of applications of AFM, including biology, materials science and polymers. A special talk will be given explaining the advantages and complementary capabilities of AFM relative to other microscopies (SEM, TEM) and analytical techniques.
For those who cannot attend the Symposium, portions will be webcast on www.Yahoo.com. Please access http://www.di.com for webcast registration information.