Carl Zeiss MicroImaging, Inc. recently introduced the innovative circular differential interference contrast (C-DIC) technique. C-DIC uses circularly polarized light, in contrast to conventional DIC, to solve insufficient contrast problems observed in classical brightfield and darkfield microscopy. Fine surface structures can be observed with high contrast and resolution simultaneously, independent of orientation. The C-DIC technique provides increased effectiveness for image inspection and analysis in many areas of materials sciences.
For additional information, call (800) 23302343, e-mail firstname.lastname@example.org or visit http://www.zeiss.com/materials .