Digital Instruments, Veeco Metrology Group, announces two new high
sensitivity, high resolution current sensing techniques, tunneling
atomic force microscopy (AFM) and conductive AFM, for electrical
characterization of small conductivity variations in samples ranging
from dielectric and ferro-electric films to nanotubes, conductive
polymers and organic materials. Applications include identification
of leakage paths, mapping of contaminants and components in composite
materials, and differentiating regions of high and low conductivity,
such as for evaluating thin film continuity and integrity.
For additional information, call (805) 967-1400, fax (805) 967-
7717 or visit http://www.veeco.com.