Ceramic Industry

Exploring the Elements of Science

February 1, 2003
The 54th annual Pittsburgh Conference will highlight new developments and opportunities for materials science and quality control professionals.

An abstract representation of the gas pycnometry density measurement technique, which is widely used to obtain material density measurements for powders and solids. Photo courtesy of Micromeritics Instrument Corp., Norcross, Ga.

More than 25,000 attendees and exhibitors from over 120 countries will gather March 9-14 at the Orange County Convention Center in Orlando, Fla., for PITTCON®* 2003, “the premier conference on laboratory science.” Also known as the Pittsburgh Conference, the event will bring together materials analysis and quality control professionals from a range of industries to discuss new opportunities and showcase new technologies in instrumentation. The exhibit hall will feature more than 1200 companies, ranging from unique niche firms to the industry giants, and the technical program will include nearly 3000 presentations in various formats. In addition, more than 80 short course topics will provide a valuable opportunity for continuing education. Following is a brief overview of some of the anticipated highlights of this year’s show.

New Product Forums

Because of the favorable response last year, the Technical Program and Exposition Committees will again hold pre-show forums designed to showcase new products, techniques and equipment. These forums will be held on Sunday, March 9, and will offer conference attendees the opportunity to obtain advance information from exhibitors on more than 40 new products of interest that will be featured during the exposition.

Products featured at the forums will include a 3D SEM/FIB for material characterization, failure analysis and quality control, presented by Trisha M. Rice, FEI Co.; a new generation of handheld energy dispersive X-ray fluorescence spectrometers, presented by Volker Thomsen and Debbie Schatzlein, NITON LLC; the Nanofinder, a 5D laser confocal spectral microscope for nanometer scale material analysis, presented by Igor Kudryashov, Pavel Rutkovski, Shoji Suruga and Jack Roberts, Symphotic, TII Corp.; solutions for quality control data management, presented by George De Ziel, Rice Lake Weighing Systems; and dynamic light scattering instruments for sizing nanoparticles, presented by Michael C. Pohl, Horiba Instruments, Inc.

Technical Symposium

The technical program will kick off with a Sunday afternoon Plenary Lecture on March 9. Over the next five days, nearly 250 of the world’s leading analytical scientists, representing academia, industry and government, will give close to 3000 product-related presentations and invited talks. Topics will include “Simulation of the Sintering Behavior of Silicon Carbide Ceramics by Means of Dilatometry and Thermokinetic Analysis,” by Bob Fidler, Juergen Blumm and Johannes Opfermann,

Netzsch Instruments Inc.; “Enhancement of Infrared Spectral Images for Maximizing Chemical Information,” by Chris W. Brown, John A. Seelenbinder, Huffman W. Scott and Bu Dongsheng, University of Rhode Island; and “Spectroscopic Tools for High-Throughput Analysis,” by Radislav A. Potyrailo, Ronald J. Wroczynski and Malgorzata Rubinsztajn, General Electric Co., Global Research Center.

Other presentations will feature such titles as “A Comparison of Constant Linear Velocity vs. Constant Flow in Gas Chromatographic Analysis,” by Ronald D. Snelling, Kari R. Urias, Charles R. Lyle and Michael Marrale, Shimadzu Scientific Instruments; “An Examination of Mid-Infrared Sampling Methods for Powdered Samples: Transmission vs. Reflectance Analysis,” by Richard A. Larsen and Mark Cruickshank, Spectral Consulting; “In-Line Analysis of Process Slurries Using Near Infrared Spectroscopy,” by Jon G. Goode, Qian Wang and Hui Li, Bruker Optics, Inc.; “Electrooxidation of Sol-Gel Encapsulated Curcumin Cast on Graphite Electrode,” by Maurice O. Iwunze, Morgan State University; and “Characterization of Surface Modified Alumina,” by Jinzhen Shi, James O. Stoffer and Thomas Schuman, University of Missouri-Rolla.


*PITTCON is a registered trademark of The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy.

For more information

For more information, contact PITTCON, 300 Penn Center Blvd., Suite 332, Pittsburgh, PA 15235-5503; (800) 825-3221; fax (412) 825-3224; e-mail info@pittcon.org; or visit http://www.pittcon.org.