The new Versa 3D™ DualBeam™ system provides high-resolution, 3-D imaging and analysis on a wide range of sample types. The instrument’s configurable platform allows customers to adapt the system’s capabilities to their specific requirements.
“The flexible configuration of the Versa 3D meets the demands of today’s researchers who study a wide variety of materials,” said Trisha Rice, vice president and general manager of the company’s Research Business Unit. “FEI’s pioneering leadership in ion beam and electron beam techniques and methodologies are well matched to give researchers information from even the most challenging samples.”
For more information, visit
www.fei.com.
