JEOL USA, Inc.: Field Emission Electron Microscope
May 29, 2003
JEOL USA, Inc. recently introduced an advanced field emission electron microscope featuring ultra-high resolution and rapid data acquisition. The new JEM-2100F is a next-generation TEM that simplifies atomic-level structural analyses in biology, medicine and materials sciences, as well as the semiconductor and pharmaceutical industries. "The JEM-2100F is designed for all advanced EM techniques, including high resolution transmission electron microscopy, electron diffraction, cryo-microscopy, in-situ microscopy, holography and tomography," said Mike Kersker, vice president. "It is ideally suited for crystallographic and chemical analyses at a sub-nanometer scale, including high-sensitivity EELS and EDS."
For more information, call (978) 535-5900 or visit http://www.jeol.com .