Ceramic Industry

Joel: New Control System For Its SEMS

May 11, 2004
ORION, an upgrade for JEOL scanning electron microscopes (SEMs), boosts the functionality of analog and DOS-based SEMs with new computer hardware and software that allow rapid digital image acquisition and control, frame averaging and frame integration. Users of older model JEOL SEMs who may still be recording images on film can now produce high-quality digital images, e-mail image files and generate reports. Depending on the model and configuration, the SEM can be upgraded to the most basic image acquisition level or can be reconfigured to also allow electron column and specimen stage control.

For more information, call (978) 535-5900 or visit http://www.jeol.com.