LEO Electron Microscopy Group recently introduced its EVO series of scanning electron microscopes. The new series blends LEO's long-standing experience in the electron microscope field with the latest technical and application innovations. Featuring new high-resolution electron optics, analytical chamber designs and specimen stages, the EVO series also offers a unique system upgrade concept and introduces the capabilities of extended variable pressure imaging (XVP). Additionally, large diameter specimens can be analyzed more easily due to a combination of large chambers and inclined detectors.
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