W.M. Hague To Exhibit At IMAPS
July 18, 2005
W. M. Hague Co. will exhibit new technologies and systems for testing ceramic based circuitry, laser trimming, solderability test and SIR test at the IMAPS 2005 show in Philadelphia, Pa., September 25-29. Technologies on display will include the new PHE Non-Contact C4 Semiconductor Package Tester. The PHE features a galvo-operated laser for die side open tests, coupled with conventional spring probe fixturing that accesses the BGA side for shorts tests. The company will also offer its R-580 electrical tester for semiconductor packages, flex and HDI PCBs. The R-580 system, when combined with a low-cost hand press fixture, provides a very low-cost solution to challenging test situations.