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The IG-1000 offers several advantages over the traditional dynamic light scattering (DLS) method. Whereas a 1-nm particle is a million times less sensitive than a 100-nm particle with DLS, the sensitivity of the IG-100 is the same no matter the particle size. The IG method also reduces or eliminates interferences from clustering or contamination by using optical signals emitted by the diffraction grating formed by the particles. Even in the single-nano region, users can obtain a satisfactory signal-to-noise ratio and stable measurement.
The IG-1000 offers a simple three-step workflow to inject the sample, insert the electrode and begin analysis. Using the IG method, the unit can measure particles in the 0.5 to 200 nm range in about 30 seconds (from measurement start to displayed results).
The IG method also ensures high reproducibility, which removes the imprecision that comes with particle analysis in the single-nano range. Comparison with raw data of diffracted light is possible, so users can perform rough validation of the measurement results easily. The IG method is also resistant to contamination, eliminating the need for measuring in a clean room. Even if the sample is mixed with small amounts of foreign particles, data is captured reliably without filtering.
In addition, users can evaluate mixed samples with the IG method because the signal size does not depend on particle size. This is not the case for other methods based on scattered light, which can make the evaluation of mixed samples difficult.
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