Veeco Metrology Group recently announced its 2002 NanoScope(R) SPM Calendar Contest, featuring state-of-the-art scanning probe microscopy images. Images generated by worldwide users of Digital Instruments and TM Microscopes systems may be submitted. Selections will be based on scientific merit as well as presentation, and winning images will be displayed in the NanoScope SPM Calendar, which is distributed to Veeco users and others worldwide. Additionally, all winners will be featured in the "NanoTheater" located on the Digital Instruments website at http://www.di.com.

For consideration, users should review Submission Guidelines at www.di.com/calendarcontest.html. After doing so, e-mail the original TIFF image created by the Digital Instruments or TM Microscopes system with caption (limit 50 words) to http://www.di.com/calendarcontest.html no later than October 15, 2001. By submitting an image via e-mail, permission is granted to Veeco Metrology Group to include the image in the NanoTheater or other publications, including application notes, articles and promotions.

Additional information on Veeco can be found at http://www.veeco.com.