Digital Instruments, Veeco Metrology Group, announces two new high sensitivity, high resolution current sensing techniques, tunneling atomic force microscopy (AFM) and conductive AFM, for electrical characterization of small conductivity variations in samples ranging from dielectric and ferro-electric films to nanotubes, conductive polymers and organic materials. Applications include identification of leakage paths, mapping of contaminants and components in composite materials, and differentiating regions of high and low conductivity, such as for evaluating thin film continuity and integrity.

For additional information, call (805) 967-1400, fax (805) 967- 7717 or visit http://www.veeco.com.