AMETEK EDAX, INC.: Super Electron Backscatter Diffraction (EBSD) Camera
The Velocity Super reportedly offers high-speed EBSD mapping with high indexing performance on real-world materials.
AMETEK EDAX, Inc. recently announced that it has added a faster, low-noise complementary metal oxide semiconductor (CMOS) camera to its Velocity™ electron backscatter diffraction (EBSD) camera series. The Velocity Super reportedly offers high-speed EBSD mapping with high indexing performance on real-world materials.
The Velocity EBSD camera series now includes two cameras tailored to specific EBSD analysis applications:
- Velocity Plus—collection speed up to 3,000 indexed points per second
- Velocity Super—collection speed up to 4,500 indexed points per second
Powered by a CMOS sensor, the Velocity EBSD camera series reportedly combines indexing speeds up to 4,500 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity cameras use 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
AMETEK EDAX reports that the Velocity EBSD cameras can be integrated with compatible EDAX EDS detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. In addition, combining the collection with EDAX ChI-Scan™ analysis results in useful integrated data for accurate phase differentiation.
Additional details are available at www.edax.com.