JEOL USA recently introduced a new scanning electron microscope (SEM) that reportedly combines the performance of a field emission SEM with the simplicity of the JEOL InTouchScope™ SEM series.

TA Instruments recently introduced a system for advanced microscopy under flow.

If nanoscience were television, we’d be in the 1950s.

This issue includes our exclusive annual R&D Lab Equipment and Instrumentation Directory, a handy tool to help you quickly find the best supplier for your specific R&D needs.*

A new imaging process can identify extremely small surface or sub-surface cracks in silicon nitride bearing balls.