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Items Tagged with 'nondestructive testing'
An internal structural defect in a ceramic chip capacitor becomes activated when it expands to create an electrical leakage path between two adjacent electrode layers.
“What is defeat? Nothing but education, nothing but the first step toward something better.” – Wendell Phillips, Abolitionist
This issue includes our exclusive annual R&D Lab Equipment and Instrumentation Directory, a handy tool to help you quickly find the best supplier for your specific R&D needs.*
Ceramics can be found in almost every aspect of our daily lives. In fact, our society has come to rely on their versatility as a material.
Following a few simple guidelines can help manufacturers manage their testing program.
A new imaging process can identify extremely small surface or sub-surface cracks in silicon nitride bearing balls.